Model TSP-02: Test Sphere Probe This sphere is intended to verify the degree of protection of enclosures for an IP2 Code per IEC 529. Sphere is hardened steel with chrome finish. |
Model TUP-01: Uninsulated Live Parts Probe For testing accessibility in accordance with many UL Standards. The handle is Delrin and the tip is stainless steel. |
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Model BEP-01: Blunt-end Probe Stainless steel probe required by various UL, CSA, IEC, and EN standards. |
Model TTP-01: Telecom Test Probe Required by IEC, EN, and some UL and CSA standards to test accessibility to TNV circuits (telecom). The handle and stop face are Delrin, the tip is stainless steel. |
Model NAF2: Wedge Probe Wedge Probe for Testing Document Shredders The NAF2 is one of two new accessibility probes required by UL 60950 for paper shredders |
Model SAW745A, B, & C : Saw Blade Accessibility Probe These accessibility probes are required by IEC60745-2-5 and 60745-2-11. They are safety requirements for saws. |
Model ITB225 : Rigid Sphere with Handle - 12.5 mm. Handle Made To Accept IEC 60529, IP2 |
Model JP04 : Jewelry Probe - 4mm diameter Simulates jewelry to IEC 61010-1, Clause 6.2.2. |